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Mots clés
Annealing
18O
Atomic Layer Deposition ALD
2H
Silicon Carbide
Auger electron spectroscopy AES
ADSORPTION DESORPTION HYSTERESIS
Sputtering
Ion implantation
7630Lh
Stable isotopic tracing
HfO2
Nanoparticles
Silicon carbide
AC susceptibility
13C
Multilayer
Channeling
Kossel diffraction
X-ray diffraction
Capillary condensation
Aluminum
EPR
Periodic multilayer
Ferromagnetic resonance
Zinc oxide
3C-SiC
15N
RBS
Adsorption
Pb centers
Defects
Evaluation
Isotopic Tracing
Diffusion
Hysteresis
6855Jk
Adsorption Isotherms
27Alda
Raman spectroscopy
Epitaxy
Nuclear resonance profiling NRP
Gold
Rutherford backscattering spectrometry RBS
NRP
17Opp
Magnetization curves
Indium oxide
Aluminium
Oxidation
8140Ef
Interface defects
Transparent conductive oxide TCO
17Op
Density functional theory
Al2O3
Pulsed laser deposition
Growth
Topological defects
Thin films
GaMnAs
Thin film
Low energy electron diffraction LEED
Metal-insulator transition
27Ald p&α
Magnetic semiconductors
Nickel
17O
Acoustic propreties of solid
Charge exchange
Nuclear reaction analysis
Nanostructures
7550Ee
Epitaxial growth
AFM
Magnetic anisotropy
Gallium oxide
Adsorbed layers
27Aldp
ALD
7550Pp
SiC
Oxygen deficiency
Passivation
Nitridation
Measurement
18O resonance
Topological insulators
Energy loss
Photoluminescence
Silica
XPS
Ion beam analysis
XRD
Alloys
Alloy
PIXE
Silicon
Ageing
Acoustic